Machine Vision
| Model | JY-TD350 |
| Max. panel size | 8-12 inch |
| Min. detection depth | 350um |
| Detection principle | Lattice two-photon effect |
| Defect Characteristics | Particles of dust, impurities, etc. |
| Applications | Wafer lithography pre-channel wafer die |
| Detection method | Dot Matrix Detection |
| Power supply | 220VAC,3500W |
| Air pressure | 85-115PSI(6-8kgf/cm2) |
| Mainframe weight | 2000Kg |
| Total size | L1.75*W1.4*H1.4m |

Phone:+86 0513-86550666
Email:jszy@jscostarnet.com